Atomic force microscopy (AFM) is a key method for working with very small objects at the nanoscale. It helps in tasks like putting together nanoparticles, handling biomolecules such as proteins or DNA, and making parts for semiconductor devices like computer chips. However, traditional AFM systems have a major limit: they cannot show clear, real-time images with high detail while manipulating these tiny items. This creates a "blind spot" that reduces how precisely and quickly the work can be done.
Researchers at the Shenzhen Institutes of Advanced Technology of the Chinese Academy of Sciences have created a new setup that fixes this issue. They linked microlens-based super-resolution optics, which is a way to see beyond normal light limits using a very small lens, with AFM. This setup allows for live, high-detail imaging to guide the manipulation process. It can handle and track features as small as tens of nanometers at the same time. The work is published in Nano Research.
How the platform operates
The method joins super-resolution optical imaging with AFM actions. The AFM part manages the force applied, the speed of movement, and the path taken. At the same time, the microlens connects to the AFM's light system to give instant visual feedback, making nanoscale work more accurate and faster.
This platform boosts imaging sharpness by more than 10 times compared to standard methods. It allows real-time following and gentle handling of items like 200-nanometer silver nanowires without damage. It also raises manipulation accuracy by over 50 percent and speeds up operations by about 200 percent. The probe's modular build, meaning it can be added or removed easily, works with existing commercial AFM machines. This makes it useful across fields without needing big changes to equipment. Areas like biosensing, which detects biological signals, nano-optics for light at small scales, and micro or nano manufacturing can benefit from this versatile tool. Overall, it opens new ways to study and build at the tiniest levels with better control and insight.